ISO/TS 17915:2013 describes methods of measuring temperature, injected current dependence and lasing spectral line width in relation to semiconductor lasers for sensing applications. ISO/TS 17915:2013 is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields. ISO/TS 17915:2013 is an application of ISO 13695, in which the physical bases are explained.
ISO/TS 17915:2013 – Optics and Photonics: Measurement Method of Semiconductor Lasers for Sensing Overview: ISO/TS 17915:2013 specifies the measurement methods […]
ISO/TS 17915:2013: Optics and Photonics Measurement Method of Semiconductor Lasers for Sensing Introduction The development of semiconductor lasers has significantly
ISO/TS 17915:2013 outlines a technical specification for the measurement method of semiconductor lasers used in sensing applications. Semiconductor lasers, commonly
